The ElectroTestExpo consortium announces the date of its second, free-to-attend event for electronics design and test engineers. It will be held on Thursday 7 April 2011 at the Bletchley Park Mansion, former home of the WWII code breakers and now host to the National Museum of Computing.
The event will combine presentations from industry experts, an end of day panel session and an exhibition area.
The dedicated, consortium-led PCB test and debug one-day event's presentations will last approximately 40 minutes, allowing time for Q & As. Topics will include: power supply measurements and analysis; self-test of switching matrices; and JTAG for functional test.
Exhibitors include Tektronix, GeoTest, JTAG Technologies, Aeroflex, Aster, MAC Panel, Pico Technology, TestWorks and Pickering Interfaces.
After the day's formal proceedings, up to 50 attendees can join in a guided tour of the museum on a first-come-first-served basis; with pre-registered applicants taking priority.
(For registration and event details, click Get Datasheet.)
