Aeroflex has launched a new software measurement suite for its PXI 3000 Series of modular instruments, to support the Time Division Duplex (TDD) mode of 3GPP Long Term Evolution (LTE) - also known as TD-LTE. The measurement suite provides LTE TDD chipset, handset and terminal device manufacturers with the advanced test capability they need to rapidly characterise device performance. In conjunction with PXI 3000 RF instrumentation and existing LTE FDD measurement suite, Aeroflex can offer comprehensive RF parametric test capability for LTE devices operating in LTE 3GPP TDD and FDD bands.
The suite is able to support all uplink and downlink configurations including special sub-frame configuration as defined in 3GPP 36.211 section 4.2. LTE analysis is supported for uplink (SC-FDMA) transmissions for all bandwidths 1.4 MHz to 20 MHz and modulation types QPSK, QAM16 and QAM64. In addition to numerical measurement results, the measurement suite provides trace displays for spectrum emission mask, CCDF, constellation plots, EVM vs. Carrier and EVM vs. Symbol. EVM analysis for uplink signals is supported for PUSCH, SRS and PUCCH.
The suite has been tested and verified against the Aeroflex TM500 TD-LTE standard test mobile, reflecting Aeroflex's capability in end-to-end testing of LTE TDD equipment.
