Keithley Instruments has launched a low-cost addition to its Series 2400 SourceMeter instrument family. The new SourceMeter instrument is optimised for high precision test applications such as current vs. voltage (I V) characterisation of photovoltaic (solar) cells, high brightness LEDs (HBLEDs), low voltage materials, and semiconductor devices, as well as resistance measurements. At a lower price it now provides these source and measurement unit capabilities at 20V and 1A signal levels. The SourceMeter operates and is programmed in exactly the same way as other Series 2400 family member units within its 1A/20V range boundaries. Like the rest of the power source measurement unit family, the new instrument integrates a highly stable DC power source with a true instrument-grade 5-1/2 or 6-1/2-digit multimeter in a single enclosure. In operation, it can act as a voltage source, a current source, a voltmeter, an ammeter, and an ohmmeter, and provides four-quadrant bipolar and automatic source/sink operation. Referring to Keithley SMU convention, operating in I vs. V quadrants 1 or 3, it operates as a source, delivering power to a load. In quadrants 2 or 4, it operates as a sink, dissipating power internally from an external source such as a PV cell or other energy source.
The instrument is suited for a variety of both benchtop and system applications with low voltage requirements and with limited test hardware budgets including high brightness LED forward/reverse I-V and LIV (light-current-voltage) testing; solar cell efficiency test (source and sink current); and precision DC load characterisation, replacing readback supplies or supply/DMM combinations, which typically provide insufficient accuracy (IDDQ testing). Other applications include: active/passive component test, voltage/current/resistance measurements; battery operation validation for portable electronic devices; characterising implantable medical devices (pacemakers, etc.); and characterising low-leakage electronic device/circuits (forward/reverse, transistor gain/leakage).
