Keithley Instruments ACS (Automated Characterisation Suite) Version 4.4 is designed for use with a number of the company's instrument and system configurations used for automated device characterisation and reliability analysis. It supports a newly enhanced reliability test option (Model ACS-2600-RTM), as well as expanded ultra-fast bias temperature instability (BTI) testing capabilities, high current testing of power components, and new project libraries designed for high voltage reliability, charge pumping, pulse-stress reliability, and stress migration testing applications. It also supports Windows 7 operating systems, which simplifies staying current with a facility's PC/system OS requirements. ACS V4.4 supports an updated optional reliability test module (Model ACS-2600-RTM) that creates and execute complex stress-measure-analyse test sequences used in device reliability tests, such as HCI, TDDB, NBTI and J-Ramp. This updated software module gives semiconductor test engineers doing device reliability testing and analysis in R&D or production test environments the tools they need to test more productively, whether characterising single devices or managing high device count test applications. ACS helps users manage complex system instrumentation configurations, and define parameters common to large groups of devices or many sub-groups.
